Products & Services

• • Cd Scatterometry
  • Ocd Optical Critical Dimension
  • Optical Filters
  • Lcd Liquid Crystal Display
  • Fpd Flat Panel Display
  • Ar Antireflective
  • Ng Nonglare
  • Mesh
  • Polarization
  • Se Shielding Effectiveness
  • Emi Electromagnetic Interference
  • Rfi Radiofrequency Interference
  • Emi Rfi Shielding
  • Satcom Satellite Communications
  • Buc Block Up Converter
  • Lnb Low Noise Block
  • Lna Low Noise Amplifier
  • Frequency Conversion
  • Cmp Chemical Mechanical Planarization
• • Laser Marking
  • Silicon Reclaim Recycle
  • Sapphire
  • Gallium Arsenide
  • C-band
  • S-band
  • L-band
  • X-band
  • Ku-band
  • Ka-band
  • 32 Nm
  • 45 Nm
  • 65 Nm
  • Mems
  • Laser Marking
  • Trench Depth
  • Photomask
  • Phase Shift
  • Integrated Metrology

Web Result

Metrology Instrumentation C4Technology

n&k Technology, Inc., manufactures advanced metrology tools for semiconductor, photomask, solar cell, flat panel display, and data storage industries. The high resolution optical metrology systems are used for film thickness, n and k, phase shift, trench depth, CD and profile measurements. The core technology is based on DUV-Vis-NIR broadband spectrophotometry with patented reflective optics, ...

http://www.c4technology.net/?page_id=12

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