electroglas, inc., develops advanced wafer probers, device handlers, test floor management software and services for the semiconductor industry.

Products & Services

• • Electroglas
  • Electroglas Inc.
  • Egls
  • Eg
  • Probers
  • Wafer Probers
  • Prober
  • Test Handler
  • Probing
  • Wafer Probing
  • Sort Floor
  • Sidewinder
  • Pathfinder
  • Sortmanager
  • Eg Net
  • Egcommander
  • Semiconductor
  • Semiconductor Processing
  • Semiconductor Manufacturing
  • Microelectronic Manufacturing
  • Wafer Testing
  • Chipmaking
  • Back-end Processing
  • Back-end Manufacturing
  • Back-end Manufacturers
  • Semiconductor Capital Equipment
  • Ic Manufacturing
  • Mems
  • Dram
  • Known Good Die
  • Kgd
  • Ball Grid Array
  • Bga
  • System-on-a-chip
  • Soc
  • 300mm
  • 200mm
  • 300mm Wafer Probers
  • 200mm Wafer Probers
  • Gemtalk 200
  • Secs/gem Standard
  • Sawyer Motor
  • Air Bearing Stages
  • Fiducial Alignment
  • Diced Wafers
  • Packaged Strips
  • Final Test
  • Networking
  • Analysis
  • Reporting
  • Wafer Map Management
  • Thin Wafers
  • Wafer Level Packages
  • Fab Floor
  • Test Floor
  • Leadframe
  • Panel
  • San Jose
  • California
  • Singapore
  • Manufacturer
  • Europe
  • Asia
  • Horizon 4090µ Plus
  • Horizon 4090µ Plus
  • Horizon 4090µ Fast Probe
  • Eg4|200
• • Eg4|200e
  • Eg5|300 Argos
  • Eg5|300e
  • Test Floor Management Software
  • Web-based Software
  • G-85
  • G85
  • Xml Maps
  • Wafer Map Software
  • Map Translation
  • Pat
  • Part Average Testing
  • Spp
  • Statistical Post Processing
  • Sbl
  • Statistical Bin Limits
  • Spc
  • Statistical Process Control
  • Apc
  • Automated Process Control
  • Strip Maps
  • Strip Test
  • Outlier Detection
  • Outliers
  • Nae
  • Neighborhood Area Exclusion
  • Halo
  • Psv
  • Process Step Verification
  • Eg Developer
  • Oee
  • Overall Equipment Effectiveness
  • E-10
  • E10
  • Semi E10
  • Remote Control
  • E-diagnostics
  • Cpk
  • Test
  • Electronic Test
  • Parametric
  • Parametric Test
  • Product File Management
  • Prober Recipe Management
  • Characterization Reports
  • Equipment Integration
  • Semiconductor Data Management
  • Semiconductor Data Analysis
  • Tqm
  • Total Quality Management
  • Ofe
  • Overall Factory Effectiveness
  • Ote
  • Overall Test Effectiveness
  • Graphical Reports
  • Charts
  • Graphs
  • Control Charts
  • Integration
  • Software Solutions
  • Functional Test
  • Binning
  • Event Action Management
  • Utilization Analysis
  • Map Display
  • Composite

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