Electroglas, Inc.
(408) 528-3000
5729 Fontanoso Way
San Jose, California,
USA
95138
electroglas, inc., develops advanced wafer probers, device handlers, test floor management software and services for the semiconductor industry.
- Year Established:
- 1960
Products & Services
-
- Electroglas
- Electroglas Inc.
- Egls
- Eg
- Probers
- Wafer Probers
- Prober
- Test Handler
- Probing
- Wafer Probing
- Sort Floor
- Sidewinder
- Pathfinder
- Sortmanager
- Eg Net
- Egcommander
- Semiconductor
- Semiconductor Processing
- Semiconductor Manufacturing
- Microelectronic Manufacturing
- Wafer Testing
- Chipmaking
- Back-end Processing
- Back-end Manufacturing
- Back-end Manufacturers
- Semiconductor Capital Equipment
- Ic Manufacturing
- Mems
- Dram
- Known Good Die
- Kgd
- Ball Grid Array
- Bga
- System-on-a-chip
- Soc
- 300mm
- 200mm
- 300mm Wafer Probers
- 200mm Wafer Probers
- Gemtalk 200
- Secs/gem Standard
- Sawyer Motor
- Air Bearing Stages
- Fiducial Alignment
- Diced Wafers
- Packaged Strips
- Final Test
- Networking
- Analysis
- Reporting
- Wafer Map Management
- Thin Wafers
- Wafer Level Packages
- Fab Floor
- Test Floor
- Leadframe
- Panel
- San Jose
- California
- Singapore
- Manufacturer
- Europe
- Asia
- Horizon 4090µ Plus
- Horizon 4090µ Plus
- Horizon 4090µ Fast Probe
- Eg4|200
-
- Eg4|200e
- Eg5|300 Argos
- Eg5|300e
- Test Floor Management Software
- Web-based Software
- G-85
- G85
- Xml Maps
- Wafer Map Software
- Map Translation
- Pat
- Part Average Testing
- Spp
- Statistical Post Processing
- Sbl
- Statistical Bin Limits
- Spc
- Statistical Process Control
- Apc
- Automated Process Control
- Strip Maps
- Strip Test
- Outlier Detection
- Outliers
- Nae
- Neighborhood Area Exclusion
- Halo
- Psv
- Process Step Verification
- Eg Developer
- Oee
- Overall Equipment Effectiveness
- E-10
- E10
- Semi E10
- Remote Control
- E-diagnostics
- Cpk
- Test
- Electronic Test
- Parametric
- Parametric Test
- Product File Management
- Prober Recipe Management
- Characterization Reports
- Equipment Integration
- Semiconductor Data Management
- Semiconductor Data Analysis
- Tqm
- Total Quality Management
- Ofe
- Overall Factory Effectiveness
- Ote
- Overall Test Effectiveness
- Graphical Reports
- Charts
- Graphs
- Control Charts
- Integration
- Software Solutions
- Functional Test
- Binning
- Event Action Management
- Utilization Analysis
- Map Display
- Composite
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