geller microanalytical laboratory, inc. is certified to ansi z540a, a2la, nvlap, iso-9001 and 17025 providing analytical serv¬ices and design and manufacturing of a limited number of unique products that are directly related to microanalysis. some of these products, such as our magnification reference standards and stage micrometers and ion sputter standards are nist and npl (national physical laboratory in the u.k.) traceable. services include scanning electron microscopy (sem), auger electron spectroscopy, metallography, microhardness, profilometry, and energy dispersive x-ray analysis.

Products & Services

• • Sem
  • Auger
  • Calibration
  • Magnification
  • Standards
  • Depth Profiling
  • Microhardness
• • Optical
  • Profilometry
  • Eds
  • Epma
  • Electron Probe
  • Metallography

Web Result

Scanning electron microscopy/energy...

Scanning Electron Microscopy & Energy Dispersive X-ray Analysis Backscattered electron image (BEI) - the image brightness is related to density Secondary electron iamge (SEI) - this provides a topography image. The above images are from a Hastolloy powder metallurgy sample. The BEI image shows the binding metal (tungsten). Note the high quality imagery which is a result of several factors incl...

http://www.gellermicro.com/services/sem.html

Geller Micro nalytical Laboratory

Geller Micro nalytical Laboratory, Inc. 426e Boston St. (Rt. 1), Topsfield, MA 01983-1216, 978 887-7000, fax 978 887-6671 Products | Laboratory Services | Computer Control Systems | Other Company Brochure(pdf) staff, history, involvement in the community, services and products, short form, long form Quality Control ISO-9001:2000, ISO-17025, ANSI Z540, OCRWM - - ACLASS (NVLAP & A2LA by mutual r...

http://www.gellermicro.com/index.htm

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