Hague Co., Inc., W. M.
(978) 433-3777
16 Lomar Industrial Park, Unit 8
Pepperell, Massachusetts,
USA
01463
w. m. hague co. supplies the fastest, most accurate, and ecconomical solutions for printed circuit and semiconductor substrate test and inspection for bare board test, non contact test, fine pitch test, flying probe board test, bga test, mcm test, c4 test, hdi test, semiconductor substrate test, printed circuit test service, sir test, dip coating, spray coating, warpage test, and flatness test.
- Year Established:
- 1959
Products & Services
-
- Laser Trimming System
- Laser Trim
- Component Trim
- Bare Board Test
- Electrical Bare Board Test
- Bare Board Electrical Test
- Printed Circuit Board Test
- Noncontact Test
- Noncontact Bare Board Test
- Flying Probe Bare Board Test
- High Volume Bare Board Test
- Semiconductor Substrate Test
- Sir Test
- Pcb Test
- Flying Probe
- Mcm Test
- Substrate Test
- Test Automation
- Quad Density
-
- L&m
- Lm
- Luther&maelzer
- Pressure Conductive Rubber
- Tdr Test
- Semiconductor Substrate Test
- Semiconductor Package Test
- Reel To Reel Test
- Roll To Roll Test
- Flexible Circuit Test
- Backplane Test
- Flatness Measurement
- Warpage Measurement
- Spray Coating
- Dip Coating
- Solderability
- Contamination Test
- Shorting Rubber
- Hdi
Web Result
- GATS-2100
- Taking the lead in innovative electrical test solutions for fine pitch test of interconnect substrates, including BGA, MCM, C4 and HDI printed circuits. GATS-2100: High Volume Semiconductor Substrate Interconnect Tester for C4, MCM, BGAs... GATS-2100 Semiconductor Substrate Test System with JEDEC tray load & unload The GATS-2100 tester features concurrent operations including: pre-align load C...
- flying probe / pin grid...
- Taking the lead in innovative electrical test solutions for fine pitch test of interconnect substrates, including BGA, MCM, C4 and HDI printed circuits. NEW! GATS-3200: Fastest Flying Probe Test System for Semiconductor Substrate Interconnect Test - C4, MCM, BGAs... GATS-3200 - Semiconductor Substrate Interconnect Test System Innovative VCM Flying Probe/Pin Grid Combination The GATS-3200 Flying Pr...
- R-580
- Taking the lead in innovative electrical test solutions for fine pitch test of interconnect substrates, including BGA, MCM, C4 and HDI printed circuits. Nidec-Read's R580 Electrical Tester provides an affordable test system for your bare board electrical test needs. You can easily integrate the R580 with your existing manual test fixtures or select from several fixture options from Nidec-Read. The...
- Non-Contact
- Taking the lead in innovative electrical test solutions. The Future of Semiconductor Substrate Testing: non-contact Technology non-contact Capacitive Sensor approach replaces moving probe, mechanical probe, and shorting rubber technologies in order to meet high throughput, high accuracy demands.by: Don Hague & Michio Kaida Non-contact measurement is emerging as the leading choice for testing s...
- Nidec-Read, HDI Semiconductor package test technology summary
- Taking the lead in innovative electrical test solutions for fine pitch test of interconnect substrates, including BGA, MCM, C4 and HDI printed circuits. Technology What level are you on? Are you fabricating today's toughest Interconnects? Then, we have test solutions for you. for C4, MCM, BGAs ... Nidec-Read is where you can find solutions to your semiconductor substrate interconnect test needs. W...
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