Global Manufacturer Pages

Lorlin Test Systems

(631) 392-1385

87 East Jefryn Blvd
Deer Park, New York, USA   11729

http://www.lorlin.com/

New and Rebuilt Discrete Semiconductor Test Systems, Test Services include screening, sorting, grading, classifying, providing complete data for your parts. We offer wafer testing, quality control and device inspection services, and complete final test and packaging here in the USA at reduced costs to your company. In addition, we have a complete line of discrete semiconductor parts both high power and low power,fully tested, and can provide data if needed for your requirements. Let Lorlin doing the testing and manufacturing and lower your cost per part. Avoid the conterfeit parts and hassles coming from other sources overseas. Save money and time with Lorlin. We have been in business for 48 years

Products & Services

    • Junotester.com
    • Juno Tester Dts-1000
    • Wei Min
    • Lorlin
    • Fettest 3400
    • Fettest 3600
    • Junotester
    • Juno Tester Dts-1000
    • Tmt
    • Tesec 881
    • Testronics 201
    • Sti 5150
    • Sti 5300
    • Screening
    • Classifying
    • Sorting
    • Verification
    • Incoming Inspection
    • Test Lab
    • Tested Transistors And Diodes To Nist
    • Test Service
    • Wafer Test. Final Test
    • Component Manufacturing
    • Transistors
    • Diodes
    • Fets
    • Scrs
    • Triacs
    • Optos
    • Keytech
    • Tektronix
    • Keithley
    • Frothingham
    • Hewlett-packard
    • Sz Testsystem
    • Iptest
    • Credence
    • Ltx
    • Tesec 881-tt/a
    • Hp 4142
    • Scientific Test 5000
    • Dataspec
    • Eaton Impact
    • Fettest 3400
    • Fettest 3600
    • Jeff Karpenski
    • Fettest 9600 9400
    • Component Test
    • Ic Testers
    • Analog Devices Lts2020
    • Genrad 1735
    • Genrad 1734
    • Genrad 1731
    • Semitek 301
    • Breakdown Voltage
    • Leakage Current
    • Current Gain
    • Hfe
    • Saturation Voltage
    • Rds
    • Vf
    • Forward Voltage
    • Icbo
    • Iebo
    • Iceo
    • Ices
    • Icer
    • Ir
    • Bvcbo
    • Bvebo
    • Bvceo
    • Bvces
    • Bvcer
    • Bvr
    • Bvz
    • 1+hfe
    • Vcesat
    • Vbesat
    • Vbeon
    • Vds
    • Vgs
    • Idss
    • Igss
    • Bvgss
    • Bvdss
    • Bvdsr
    • Bvdsd
    • Zz
    • Zzl
    • Igt
    • Vgt
    • Vt
    • Iakr
    • Iakf
    • Bvakr
    • Bvakf
    • Ih
    • Il
    • Von
    • Cob
    • Ciss
    • Cib
    • Crss
    • On State
    • Off State
    • Testing Transistors
    • Curve Tracer
    • Diode Tester
    • Fet Tester
    • Scr Tester
    • Semitek 301
    • Tesec 8101
    • Tesec 8001
    • Tesec 9214
    • Tesec 9414
    • Contrel
    • Cimtek
    • Intest
    • Mc Systems
    • Micro Control
    • Juno
    • Tek 576
    • Tek 176
    • Tek 577

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