MATERIALS DEVELOPMENT CORP
(818) 700-8290
21541 Nordhoff St
Chatsworth, California,
USA
91311-5875
your best source for capacitance-voltage and semiconductor measurement systems
- Year Established:
- 1970
Products & Services
-
- C-v Plotter
- Cv Plotter
- Semiconductor Measurements
- Solid State Measurements
- Msi
- Current-voltage
- C-v
- I-v
- Flatband
- Cv
- Iv
- Capacitance
- Voltage
- Capacitance-voltage
- Cvbt
- Bias-temperature-stress
- Gate Oxide Integrity
- Goi
- Gaas
- Gallium Arsenide
- Silicon
- Si
- Gv
- G-v
- Conductance Voltage
- Mdc
- Materials Development Corporation
- Mos
- Metal Oxide Semiconductor
-
- Duochuck
- Quietchuck
- Mobile Ion
- Nmi
- Dielectric Constant
- Resistivity
- Permitivity
- Pn Junction
- Mis
- Mosfet
- Dit
- J-t
- C-t
- Qss
- Nss
- Tddb
- Tzbd
- Qbd
- Nm
- Hg Probe
- Mercury Probe
- Tvs
- Quasistatic
- Hot Chuck
- Dopant
- Doping Profile
- C-v
- Cv
Web Result
- SPARE PARTS IDENTIFICATION
- HOME ABOUT NEW PRODUCTS SERVICES REPS CONTACT LITERATURE TECH TIPS SITE MAP CALCULATORS Parts Identification Page This page is to help you identify selected spare parts so you may more easily order replacements. Each link goes to the section of spares for that item. Please note that not all spare parts are listed. Only those that may be difficult to describe or order. Click on the thumbnail for la...
Website Links:
MATERIALS DEVELOPMENT CORP | Breakdown Voltage | CALCULATORS | CONDUCTANCE | COPPER DIFFUSION | CRYOGENIC PROBE STATION | CURRENT | CUSTOM | C-V PLOTTERS | Depletion - Depth | DIELECTRIC CONSTANT | Doping - Resistivity | DRIVE-LEVEL CAPACITANCE... | ELECTROCHEMISTRY | EUROPE | FOUR POINT PROBE | HOT CHUCKS | INTERFACE TRAP | ION IMPLANT | JUNCTION
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