Metricon Corp.
(609) 737-1052
12 N. Main St.
Pennington, New Jersey,
USA
08534
metricon corporation has pioneered the practical application of prism coupling technology to problems of thin film, bulk material, and optical waveguide characterization. the model 2010, the third generation in metricon's family of prism coupling instruments, is now used by more than 450 users in 25 countries.
- Year Established:
- 1980
Products & Services
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- Surface Plasmon Resonance
- Plasmon
- Spr
- Biosensor
- Prism Coupling
- Prism Coupler
- Birefringence
- Thin Film Thickness
- Waveguide Loss
- Prism Coupler
- Refractometer
- Abbe Refractometer
- Polymers
- Sairon Technolgy
- Inc.
- Sairon Technology
- Sairon
- Vamfo
- Metricon
- Prism Coupling
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- Ellipsometry
- Ellipsometer
- Optical
- Waveguide
- Refractive
- Index
- Birefringence
- Thin Film
- Film Thickness
- Waveguide Loss
- Refractometer
- Abbe
- Refractometer
- Polymers
- Vamfo
- Metricon
- Prism Coupling
- Ellipsometry
- Ellipsometer
Web Result
- Metricon - Applications
- HOME Model 2010/M Overview Applications Application Notes Optical Waveguide Characterization Waveguide Loss Measurement Bulk Material or Thick Film Index/Birefringence Measurement Measuring Effects of Nanomaterials and Other Dopants on Index Spectroscopic Measurements of Index Vs Wavelength Characterization of SPR and Waveguide Structures for Sensor Applications High Accuracy Measurement of Resist...
- Characterization of SPR...
- Metricon - Applications
Website Links:
METRICON CORP | Bulk Material or Thick... | Characterization of SPR... | Dual Film Measurements | Features & Specifications | High Accuracy Measurement... | Measuring Effects of... | Measuring Index of Contact... | Measuring Index Vs Temperature... | Measuring Index/Birefringence... | Non-Contact Measurement... | Sales Reps | To top of page | Waveguide Loss Measurement
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