manufacturer of automatic test equipment (ate) for flash memory devices.

Products & Services

• • Novtek
  • Non Volatile Memory
  • Nvm
  • Ate
  • Test
  • Flash
  • Flash Memory
  • Flash Memory Test
  • Test Systems
  • Automatic Test Equipment
  • Eprom
  • Eeprom
  • Pmu
  • Apg
  • Wafersort
  • Wafer Sort
  • Production Test
  • Cycling
  • Endurance Cycling
  • Redundancy
  • Burn-in
  • Htrb
  • Jedec
  • Mil-std-883d
  • Tdbi
  • Dynamic Life Test
  • Bit Map
  • Fowler-nordheim Tunneling
  • Mask Rom
  • Feram
  • Fram
  • Hast
  • Jesd22
  • Failure Mechanism
  • Redundancy Repair
  • Algorithmic Pattern Generator
  • Vector Pattern Generator
• • Data Log
  • Wafer Map
  • Jtag
  • Dut
  • Dib
  • Environmental
  • Automated Test Equipment
  • Parallel Test Systems
  • Split Gate
  • Floating Gate
  • Tunnel Oxide
  • Accelerated Testing
  • Activation Energy
  • Barlow's Method
  • Bath-tub Curve
  • Fimodal
  • Degradation
  • Duane's Model
  • Eyring Equation
  • Failure Analysis
  • Infant Mortality
  • Failure Mechanisms
  • Markov Model
  • Markovian Burn-in
  • Reliability
  • Stress
  • Mil-hdbk-217c
  • Electron Mobility
  • Mil-std-38510
  • Nvsram
  • Stacked Gate
  • Functional Test
  • Ac Test
  • Access Time
  • E2prom
  • Pin Driver
  • Pin Electronics

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