Products & Services

• • Reliability Tests And Analysis
  • Reliability And Quality Systems
  • Reliability And Quality Program
  • New Product Introduction Process
  • Npi
  • Thermal Characterization And Analysis
  • Device Junction Temperature
  • Mtbf And Fit Rate Analysis
  • Fixture Design And Test
  • Semiconductor Junction Temperature
  • Infra-red And Liquid Crystal Temperature
  • Junction Temperature Measurements
  • Heat Sink Design And Tests
  • Product Qualification
  • Jedec (jesd47e)
  • Telcordia (g463) And Military Standards (883e) And Tests
  • Electrostatic Discharge Test (esd)
  • Latch Up Device Test (lu)
  • Solder Fatigue Life Tests And Life Prediction
• • Accelerated Reliability Life Tests
  • Halt And Hass Tests
  • Design Margin Tests (dmt)
  • High Temperature Operating Life Tests (htol)
  • Biased Highly Accelerated Stress Tests (bhast)
  • Temperature Cycling Tests (tcy)
  • Temperature And Humidity Tests
  • Failure Analysis
  • Xray
  • Evt
  • Dvt
  • Hts
  • Pind
  • Msl
  • Csam
  • Autoclave
  • Hast
  • Daisy Chain Design Evaluation Tests
  • High Temp Storage

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