Products & Services

• • Asic
  • Ate
  • Automatic Test Equipment
  • Atpg
  • Automatic Test Pattern Generation
  • Bist
  • Built-in-self-test
  • Boundary Scan
  • Compact Vectors
  • Concurrent Fault Simulation
  • Dfd
  • Design For Debug / Diagnosis
  • Debug
  • Dft
  • Design-for-test
  • Dft Checkers
  • Dft Integration
  • Diagnosis
  • Eda
  • Electronic Design Automation
  • Embedded
  • Embedded Test
  • Fault Coverage
  • Fault Simulation
  • Hdl
  • Hardware Description Language
  • Ic
  • Integrated Circuit
  • Ieee-1148.1
• • Ip
  • Intellectual Property
  • Interconnect Testing
  • Jtag
  • Logic Bist
  • Logic
  • Memory Bist
  • Memory
  • Pattern Compressionpcb Testing
  • Production Testing
  • Prototype Debug
  • Prototype Diagnosis. Prototype Testing
  • Rtl
  • Register Transfer-level
  • Scan
  • Silicon Debug
  • Soc
  • Stitching
  • Stil
  • Standard Transfer Interface Language
  • System-on-chip
  • Syntest
  • Test
  • Test Cost
  • Test Cost Reduction
  • Vhdl
  • Vhsic Hdl
  • Very High-speed Integrated Circuit Hdl
  • Wgl

Web Result

Trident, Fujitsu, NEC,...

FOR RELEASE NOVEMBER 3, 1997 ITC Booth 2701For Information Contact:Georgia Marszalek, SynTest, Public Relations Counsel(650) 345-7477 FAX: (650) 341-0388, georgia@valleypr.comwww.syntest.com Trident, Fujitsu, NEC, and Silicon Motion Praise SynTest's Fault SimulatorTurboFault Adds Distributed Fault Simulation, SDF Support, DAI Interface Washington DC--November 3, 1997 - International Test Conferenc...

http://www.syntest.com/OtherPressRelease/19971103.htm

LG Semicon Licenses Its...

LG Semicon Licenses Its HDL Logic Simulator to SynTest Technologies SynTest plans to use the simulator to add an RTL fault simulator to its product line; Sunnyvale, CA, USA and Seoul, Korea?January 18, 1999?SynTest Technologies, Inc. (Sunnyvale, CA, USA), an EDA Company and supplier of DFT tools for IC designers and foundries, and LG Semicon announced today that SynTest has licensed the source cod...

http://www.syntest.com/PressReleaseArchive/19990118.htm

here.

TurboFault Demo/Tutorial PageCombinational Circuits:mul64 adder16Synchronous Circuits;counter16 fifo Application Notes: Library Modeling: Memory Modeling: BlackBox Modeling: TF VCD output: Selective Strobing: Back to Demo/Tutorial Please download exercise files turbofaultexercise.tar.gz, create a directory for it and use "gunzip turbofaultexercise.tar.gz" and "tar xvf turbofaultexercise.tar" comma...

http://www.syntest.com/TurboFaultDemo.htm

SynTest Adds Linux Platform...

SynTest Adds Linux Platform Support For Its DFT Solutions Linux Speeds DFT Tool Performance Two to Five Times SUNNYVALE, Calif., USA, May 24, 2000 -- SynTest Technologies, Inc., an EDA Company and supplier of DFT tools for IC designers and foundries, announced today that the company has added support for the Linux platform to its existing support for the UNIX platform. SynTest's products improve a...

http://www.syntest.com/PressReleaseArchive/20000529.htm

SYNTEST INTRODUCES NEW...

FOR RELEASE June 9, 1997 DAC Booth 1300For Information Contact:Georgia Marszalek, SynTest, Public Relations Counsel(415) 345-7477, FAX: (415) 341-0388, georgia@valleypr.comwww.syntest.comSYNTEST INTRODUCES NEW VERSION OF ITS ATPG TOOL Customers confirm TurboScan(tm) has better test vector compaction, achieves higher fault coverage with less silicon, and reduces design and test time by up to 50% An...

http://www.syntest.com/OtherPressRelease/19970609.htm

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