www.emcourses.com
+44 (0)1280 814774
6 Hillcrest Way Buckingham Industrial Park
Buckingham, ,
United Kingdom
MK18 - 1HJ
http://www.emcourses.com/temadvice.htm
Products & Services
-
- Aperture
- Squares
- Operating Instrument
- Scanning Electron Microscopes
- Array
- Down
- Sphere
- Well Engineering
- Tags
- Engineering Service Well
- Microscopes
- Microscope Scanning Electron
- Condenser Lens
- In And Out
- Web
- Different
- Transmission
- Etching
- Instruments
- Sections
- System
- Profiles
- Edge Beam
- Electron Guns
- Voltage Instrument
- Technique
- Specimen
- Flex
- Maintenance
-
- Materials
- Screws: Sems
- Pliers
- Microscope Transmission Electron
- Electron Microscopes
- Lens Condenser
- Lens
- Sections Material
- Beams
- Electrons
- Through Condenser
- Lens Instrument
- Tag Guns
- Transmission System
- Scanning System
- Latex
- Columns
- Tweezers
- Packings
- Gun
- Heavy Pliers
- Preparations
- Casts
- Transmission Electron Microscopes
- Contacts
- Material Material
- Links
- Beam Unit
- Microscope Electron
Web Result
- Steve Chapman's -SEM, TEM & EDX Hints and TipsElectron Microscopy Hints and Tips
- Electron Microscopy Hints and Tips Click on the Part that you need, at the moment there are 26 parts Part 1.....................................Filaments, filament life and breakages. Part 2....................................Spot Size in the TEM Part 3.....................................Cleaning a Cathode Assembly Part 4.....................................Probe Current in the SEM Part 5...........
- Part 18
- Scanning Electron Microscope Signals Extracts from the Protrain e-book series "Working With a Scanning Electron Microscope" [Contrary to most SEM operators view of their results being solely due to secondary electrons, this presentation tries to introduce the contribution of backscatter into the operators minds. Too few understand that backscatter may either enter directly into the "so called" sec...
- Part 13
- Contrast in SEM Images Whilst it is understandable that the surface topography of a specimen dictates the contrast changes that portray the specimen image, there are other reactions that add or subtract contrast from the image. Contrast changes will result from a change in accelerating voltage, spot size (probe current) and tilt angle, each of which change the secondary electron to backscattered e...
- Part 15
- Signals in X-Ray Analysis The incident beam electrons themselves do not directly generate all of the x-rays entering the x-ray detector. Backscattered electrons, plus in the TEM forward scattered electrons, also generate signals from the media surrounding the specimen. In both instruments, unless special precautions are put in place, an operator must consider a spectrum in the light of which eleme...
- Part 9
- Buying a New Electron Microscope A Users Guide As part of the consultancy side of Protrain's business we purchase scanning and transmission electron microscopes for our clients. This means we are buying instruments regularly and are therefore probably one of the few professional electron microscope purchasing organisations? In our team we have staff who have worked for most of the electron mic...
Website Links:
Own this business?
Request to update the information