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AXIC, INC.
Santa Clara, California, USA
ellipsometer, ellipsometry, thin film metrology, thin film measurement, thickness measurement, spectroscopic ellipsometry, spectroscopic ellipsometer, reflectometer, ...
Product
I. V. I. CORP.
Pembroke, Massachusetts, USA
vacuum equipment, high vacuum equipment, vacuum systems, vacuum metallizing equipment, vacuum coating equipment, optical coating equipment, vacuum deposition ...
R F VII, INC.
Williamstown, New Jersey, USA
rf, rf vii, rf generator, power supplies, rfpp, ae, rf power products, rf plasma products, rf-10, rf-20, matching networks, service, eni, am-5, plasma, ...
VEECO ION BEAM EQUIPMENT, INC.
Fort Collins, Colorado, USA
afm, atomic force microscope, nanotechnology, nanobiology, perpendicular recording, nexus, dwdm, mems, data storage, metrology, pvd, optical coating, ...
MANUFACTURING TECHNOLOGY, INC.
Camarillo, California, USA
afm, atomic force microscope, nanotechnology, nanobiology, perpendicular recording, nexus, dwdm, mems, data storage, metrology, pvd, optical coating, ...
VEECO, INC. (H Q)
Woodbury, New York, USA
afm, atomic force microscope, nanotechnology, nanobiology, perpendicular recording, nexus, dwdm, mems, data storage, metrology, pvd, optical coating, ...
VEECO INSTRUMENTS, INC.
St. Paul, Minnesota, USA
afm, atomic force microscope, nanotechnology, nanobiology, perpendicular recording, nexus, dwdm, mems, data storage, metrology, pvd, optical coating, ...
VEECO PROCESS METROLOGY GROUP
Tucson, Arizona, USA
afm, atomic force microscope, nanotechnology, nanobiology, perpendicular recording, nexus, dwdm, mems, data storage, metrology, pvd, optical coating, ...
48TH RESEARCH INSTITUTE OF CHINA ELECTRONIC TECHNOLOGY GROUP CORP.
Changsha, Hunan, China
chemical vapor deposition equipment, di ionic bundle sputter coating machine, electron beam exposure equipment, four tube fine control dispersing/oxidation oven, ...